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Time-to-first-spike (TTFS) encoded spiking neural networks (SNNs), implemented using memristive crossbar arrays (MCA), achieve higher inference speed and energy efficiency compared to artificial neural networks (ANNs) and rate encoded SNNs. However, memristive crossbar arrays are vulnerable to conductance variations in the embedded memristor cells. These degrade the performance of TTFS encoded SNNs, namely their classification accuracy, with adverse impact on the yield of manufactured chips. To combat this yield loss, we propose a postmanufacture testing and tuning framework for these SNNs. In the testing phase, a timing encoded signature of the SNN, which is statistically correlated to the SNN performace, is extracted. In the tuning phase, this signature is mapped to optimal values of the tuning knobs (gain parameters), one parameter per layer, using a trained regressor, allowing very fast tuning (about 150ms). To further reduce the tuning overhead, we rank order hidden layer neurons based on their criticality and show that adding gain programmability only to 50% of the neurons is sufficient for performance recovery. Experiments show that the proposed framework can improve yield by up to 34% and average accuracy of memristive SNNs by up to 9%. 

Resistive random access Memory (RRAM) based spiking neural networks (SNN) are becoming increasingly attractive for pervasive energy-efficient classification tasks. However, such networks suffer from degradation of performance (as determined by classification accuracy) due to the effects of process variations on fabricated RRAM devices resulting in loss of manufacturing yield. To address such yield loss, a two-step approach is developed. First, an alternative test framework is used to predict the performance of fabricated RRAM based SNNs using the SNN response to a small subset of images from the test image dataset, called the SNN response signature (to minimize test cost). This diagnoses those SNNs that need to be performance-tuned for yield recovery. Next, SNN tuning is performed by modulating the spiking thresholds of the SNN neurons on a layer-by-layer basis using a trained regressor that maps the SNN response signature to the optimal spiking thresholdvalues during tuning. The optimal spiking threshold values are determined by an off-line optimization algorithm. Experiments show that the proposed framework can reduce the number of out-of-spec SNN devices by up to 54% and improve yield by as much as 8.6%. 

While resistive random access memory (RRAM) based deep neural networks (DNN) are important for low-power inference in IoT and edge applications, they are vulnerable to the effects of manufacturing process variations that degrade their performance (classification accuracy). However, to test the same post-manufacture, the (image) dataset used to train the associated machine learning applications may not be available to the RRAM crossbar manufacturer for privacy reasons. As such, the performance of DNNs needs to be assessed with carefully crafted dataset-agnostic synthetic test images that expose anomalies in the crossbar manufacturing process to the maximum extent possible. In this work, we propose a dataset-agnostic post-manufacture testing framework for RRAM-based DNNs using Entropy Guided Image Synthesis (EGIS). We first create a synthetic image dataset such that the DNN outputs corresponding to the synthetic images minimize an entropy-based loss metric. Next, a small subset (consisting of 10-20 images) of the synthetic image dataset, called the compact image dataset, is created to expedite testing. The response of the device under test (DUT) to the compact image dataset is passed to a machine learning based outlier detector for pass/fail labeling of the DUT. It is seen that the test accuracy using such synthetic test images is very close to that of contemporary test methods. 

We investigate various properties of extremal dyonic static black holes in Einstein-Maxwell-Dilaton-Axion theory. We obtain a simple first-order ordinary differential equation for the black hole mass in terms of its electric and magnetic charges, which we can solve explicitly for certain special values of the scalar couplings. For one such case we also construct new dyonic black hole solutions, making use of the presence of an enhanced $SL(2,\mathbb{R})$symmetry. Finally, we investigate the structure of long range forces and binding energies between nonequivalent extremal black holes. For certain special cases, we can identify regions of parameter space where the force is always attractive or repulsive. Unlike in the case without an axion, the force and binding energies between distinct black holes are not always correlated with each other. Our work is motivated in part by the question of whether long range forces between nonidentical states can potentially encode information about UV constraints on low-energy physics. Published by the American Physical Society2025 

Resistive random access memory (RRAM) based memristive crossbar arrays enable low power and low latency inference for convolutional neural networks (CNNs), making them suitable for deployment in IoT and edge devices. However, RRAM cells within a crossbar suffer from conductance variations, making RRAM-based CNNs vulnerable to degradation of their classification accuracy. To address this, the classification accuracy of RRAM based CNN chips can be estimated using predictive tests, where a trained regressor predicts the accuracy of a CNN chip from the CNN’s response to a compact test dataset. In this research, we present a framework for co-optimizing the pixels of the compact test dataset and the regressor. The novelty of the proposed approach lies in the ability to co-optimize individual image pixels, overcoming barriers posed by the computational complexity of optimizing the large numbers of pixels in an image using state-of-the-art techniques. The co-optimization problem is solved using a three step process: a greedy image downselection followed by backpropagation driven image optimization and regressor fine-tuning. Experiments show that the proposed test approach reduces the CNN classification accuracy prediction error by 31% compared to the state of the art. It is seen that a compact test dataset with only 2-4 images is needed for testing, making the scheme suitable for built-in test applications. 

A key challenge in e-learning environments like Intelligent Tutoring Systems (ITSs) is to induce effective pedagogical policies efficiently. While Deep Reinforcement Learning (DRL) often suffers from \textbf{\emph{sample inefficiency}} and \textbf{\emph{reward function}} design difficulty, Apprenticeship Learning (AL) algorithms can overcome them. However, most AL algorithms can not handle heterogeneity as they assume all demonstrations are generated with a homogeneous policy driven by a single reward function. Still, some AL algorithms which consider heterogeneity, often can not generalize to large continuous state space and only work with discrete states. In this paper, we propose an expectation-maximization(EM)-EDM, a general AL framework to induce effective pedagogical policies from given optimal or near-optimal demonstrations, which are assumed to be driven by heterogeneous reward functions. We compare the effectiveness of the policies induced by our proposed EM-EDM against four AL-based baselines and two policies induced by DRL on two different but related tasks that involve pedagogical action prediction. Our overall results showed that, for both tasks, EM-EDM outperforms the four AL baselines across all performance metrics and the two DRL baselines. This suggests that EM-EDM can effectively model complex student pedagogical decision-making processes through the ability to manage a large, continuous state space and adapt to handle diverse and heterogeneous reward functions with very few given demonstrations. 

Variability-induced accuracy degradation of RRAMbased DNNs is of great concern due to their significant potential for use in future energy-efficient machine learning architectures. To address this, we propose a two-step process. First, an enhanced testing procedure is used to predict DNN accuracy from a set of compact test stimuli (images). This test response (signature) is simply the concatenated vectors of output neurons of intermediate and final DNN layers over the compact test images applied. DNNs with a predicted accuracy below a threshold are then tuned based on this signature vector. Using a clustering based approach, the signature is mapped to the optimal tuning parameter values of the DNN (determined using off-line training of the DNN via backpropagation) in a single step, eliminating any post-manufacture training of the DNN weights (expensive). The tuning parameters themselves consist of the gains and offsets of the ReLU activation of neurons of the DNN on a per-layer basis and can be tuned digitally. Tuning is achieved in less than a second of tuning time, with yield improvements of over 45% with a modest accuracy reduction of 4% compared to digital DNNs.